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Advanced microscopy methods rely increasingly on adaptive compensation of aberrations and on advanced illumination to increase resolution and reduce the effects of scattering. In this topical meeting we bring together experts from different fields in the fundamentals as well as in application of adaptive optics and advanced illumination. Such applications are found in microscopy, beam-shaping, imaging in scattering media, metrology, medical applications and astronomy. Special emphasis will be put on the enabling technologies for such applications. Thus, novel adaptive optical elements, algorithms, sensors and illumination methods are within the scope of this TOM. Furthermore, we aim to bring together researchers from universities and institutes with industrial representatives fabricating advanced optical equipment for adaptive optics and adaptive illumination, thus addressing the whole range of fundamental research, applied optics and system development.